Application-specific test systems.

Measurement instruments, sensors, fixtures, and mechanical and thermal infrastructure are integrated into a single system architecture with LabVIEW-based automation.

Systems Photodetector Probe Station Thermal Chuck View in brochure ↗

System approach

Infrastructure scaled to the test scenario.

Electrical, optical, pulsed, and thermal measurements are managed within a single system together with probe contact, environmental conditioning, data acquisition, and automated reporting.

ElectricalI-V · C-V · Pulsed I-V

AutomationTest scenarios and batch testing

ThermalEnvironmental chamber · Thermal chuck

OutputDevice-level data and reports

Gen2 photodetector characterization

Fully automated batch testing in an environmental chamber.

Test sequencing, instrument control, probe contact, data acquisition, and reporting are managed within the same automation infrastructure.

Capacity50 devices

Temperature−54 °C / +71 °C

Voltage / current+200 V · approximately 1 pA resolution

Laser pulse1 ns

Automated photodetector test system inside an environmental chamber

COMING SOON

New product · Probe Station

Precision manual probe station.

Designed for precision electrical characterization of samples ranging from small specimens to substrates up to 150 mm. Probe needles positioned under a microscope enable accurate electrical measurements.

Sample capacityUp to 150 mm

PositioningPrecision manual motion

StatusUnder development

Lithorium manual probe station under development

COMING SOON

Representative image.

Thermal Chuck

Controlled thermal platform for probe stations.

Controlled heating from room temperature to 120 °C, thermal uniformity below 1% across the surface, and mechanical integration for different probe stations.

Actual Thermal Chuck system integrated into a probe station

Thermal-camera image of the Thermal Chuck rotated 90 degrees counterclockwise

120 °CMaximum temperature

< 1%Thermal uniformity

6 inchVacuum sample holding

Flexible integrationCustom mounting adapter for different probe stations